The 2002 NEC implemented new requirements to help reduce the number of electrical fires caused by parallel arc faults in branch circuit wiring. All branch circuits supplying bedrooms in single-family ...
Delay-inducing defects are causing increasing concern in the semiconductor industry today, particularly at the leading-edge 130- and 90- nanometer nodes. To effectively test for such defects, the ...
EAST AURORA, N.Y.--(BUSINESS WIRE)--Astronics Corporation (NASDAQ:ATRO), a leading provider of advanced technologies for the global aerospace, defense and semiconductor industries, announced today ...
A new technical paper titled “Aging Aware Steepening of the Fault Coverage Curve of a Scan Based Transition Fault Test Set” was published by researchers at Purdue University. “Chip aging may result in ...
The Smart-Thump from HDW Electronics is a fully integrated underground cable fault locating system that requires less training than a traditional thumper because it interprets the results of the ...
New non-volatile memories (NVM) bring new opportunities for changing how we use memory in systems-on-chip (SoCs), but they also add new challenges for making sure they will work as expected. These new ...
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