Provides a complete range of structural measurements including powder diffraction, thin film metrology including thin-film method, preferred orientation, crystal quality, reflectometry and grazing ...
The new method can determine crystal structures underlying experimental data thus far difficult to analyze. A joint research team led by Yuuki Kubo and Shiji Tsuneyuki of the University of Tokyo has ...
The Scintag XDS2000 powder diffractometer is configured with a graphite monochromater and IBM compatible workstation running Scintag DMSNT software in Windows NT environment. New cameras installed in ...
Electron diffraction is a powerful analytical technique used to study the atomic structure of materials. It involves the interaction of a beam of electrons with a crystalline sample, resulting in a ...
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